Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems

Rebecca Barocco, Won Suk Lee, and Garret Hortman

Release Date: 8/31/2020

Reviewed At: 9/27/2023

DOI: 10.32473/edis-ae518-2017

Agriculture

About this Publication

This document is AE518, one of a series of the Department of Agricultural and Biological Engineering, UF/IFAS Extension. Original publication date February 2017. Visit the EDIS website at https://edis.ifas.ufl.edu for the currently supported version of this publication.

About the Authors

R. Barocco, Doctor of Plant Medicine, postdoctoral associate, Plant Pathology Department; W. S. Lee, professor, Department of Agricultural and Biological Engineering, UF/IFAS Extension, Gainesville, FL 32611; and G. Hortman, integrated solutions manager, Ag-Pro, Thomasville, GA 31792.

How to Cite

Barocco, R., Lee, W. S. D., & Hortman, G. (2017). Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems. EDIS, 2017(3). https://doi.org/10.32473/edis-ae518-2017

Authors

Rebecca Barocco

staff

University of Florida

agricultural food and biological scientist II, Ph.D., UF/IFAS North Florida Research and Education Center, Quincy, FL

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Won Suk Lee

Contact

Specialist

University of Florida

professor, machine vision and precision agriculture, UF/IFAS Department of Agricultural and Biological Engineering, Gainesville, FL

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Publication #AE518

Disclaimers

The use of trade names in this publication is solely for the purpose of providing specific information. UF/IFAS does not guarantee or warranty the products named, and references to them in this publication do not signify our approval to the exclusion of other products of suitable composition.